other Pseudo-Random Pattern Generators (PRPG) have become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. The current paper describes a training and research tool for learning basic and advanced issues related to PRPG-based test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR parameters. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The multi-platform JAVA runtime environment allows for easy access a...
ABSTRACT: The fault coverage and hardware over head of a circuit is an important problem in VLSI cir...
An environment targeted to e-learning is presented for teaching design and test of electronic system...
Abstract – A system for teaching design and test of digital devices and systems at different levels ...
The paper presents a tool that explains and demonstrates the essentials of RAM testing and memory bu...
This paper describes a training and research tool for learning basic issues related to BIST (Built-I...
Abstract. A method called “living pictures ” to combine learning, training and research pha-ses in a...
ABSTRACT: A conception of training system for teaching design and test of digital devices is present...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
This paper presents a realistic test approach suitable to Design For Testability (DFT) and Built- In...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
Particularly, several hybrid BIST schemes store deterministic top-up patterns around the tester insi...
Memories are one of the most important components in digital systems like SoCs. The high density of ...
A method for testing embedded core based system chips is to use a built-in-self-test (BIST). A mixed...
ABSTRACT: A conception of practical works for teaching design and test of didital sircuits is given....
ABSTRACT: The fault coverage and hardware over head of a circuit is an important problem in VLSI cir...
An environment targeted to e-learning is presented for teaching design and test of electronic system...
Abstract – A system for teaching design and test of digital devices and systems at different levels ...
The paper presents a tool that explains and demonstrates the essentials of RAM testing and memory bu...
This paper describes a training and research tool for learning basic issues related to BIST (Built-I...
Abstract. A method called “living pictures ” to combine learning, training and research pha-ses in a...
ABSTRACT: A conception of training system for teaching design and test of digital devices is present...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
This paper presents a realistic test approach suitable to Design For Testability (DFT) and Built- In...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
Particularly, several hybrid BIST schemes store deterministic top-up patterns around the tester insi...
Memories are one of the most important components in digital systems like SoCs. The high density of ...
A method for testing embedded core based system chips is to use a built-in-self-test (BIST). A mixed...
ABSTRACT: A conception of practical works for teaching design and test of didital sircuits is given....
ABSTRACT: The fault coverage and hardware over head of a circuit is an important problem in VLSI cir...
An environment targeted to e-learning is presented for teaching design and test of electronic system...
Abstract – A system for teaching design and test of digital devices and systems at different levels ...