Wirelength estimation techniques typically contain a site density function that enumerates all possible path sites for each wirelength in an architecture and an occupation probability function that assigns a probability to each of these paths to be occupied by a wire. In this paper we apply a generating polynomial technique to derive complete expressions for site density functions which take effects of layout region aspect ratio and the presence of obstacles into account. The effect of an obstacle is separated into two parts: the terminal redistribution effect and the blockage effect. The layout region aspect ratio and the obstacle area are observed to have a much larger effect on the wirelength distribution than the obstacle’s aspect ratio...
We conjecture that good column-based placements can be produced by minimizing two wire crossing numb...
Abstract — This article describes an algorithm for curvilinear detailed routing. We significantly im...
The growing impact of process variation on circuit performance requires statistical design approache...
Wirelength estimation techniques typically contain a site density function and an occupation probabi...
Wirelength estimation in VLSI layout is fundamental to any pre-detailed routing estimate of timing o...
Abstract- Efficient and accurate interconnect estimation is crucial to design convergence. With Syst...
Wirelength estimation in VLSI layout is fundamental to any pre-detailed routing estimate of timing o...
ABSTRACT – We present a novel technique for estimating individual wire lengths in a given standardce...
We address the classic wire-length estimation problem and propose a new statistical wire-length esti...
In this paper, the classic wire-length estimation problem is addressed and a new statistical wire-le...
Wires have become a major source of bottleneck in current VLSI designs, and wire length prediction i...
Interconnect prediction is very important for early feasibility studies in modern design flows. Most...
With the increasing sophistication of circuits and specifically in the presence of IP blocks, new es...
This dissertation describes a sub-system of an Arithmetic Design System (ADS) which is intended to e...
Abstract-- In this paper we present a method to estimate the layout area of DSP algorithms that are ...
We conjecture that good column-based placements can be produced by minimizing two wire crossing numb...
Abstract — This article describes an algorithm for curvilinear detailed routing. We significantly im...
The growing impact of process variation on circuit performance requires statistical design approache...
Wirelength estimation techniques typically contain a site density function and an occupation probabi...
Wirelength estimation in VLSI layout is fundamental to any pre-detailed routing estimate of timing o...
Abstract- Efficient and accurate interconnect estimation is crucial to design convergence. With Syst...
Wirelength estimation in VLSI layout is fundamental to any pre-detailed routing estimate of timing o...
ABSTRACT – We present a novel technique for estimating individual wire lengths in a given standardce...
We address the classic wire-length estimation problem and propose a new statistical wire-length esti...
In this paper, the classic wire-length estimation problem is addressed and a new statistical wire-le...
Wires have become a major source of bottleneck in current VLSI designs, and wire length prediction i...
Interconnect prediction is very important for early feasibility studies in modern design flows. Most...
With the increasing sophistication of circuits and specifically in the presence of IP blocks, new es...
This dissertation describes a sub-system of an Arithmetic Design System (ADS) which is intended to e...
Abstract-- In this paper we present a method to estimate the layout area of DSP algorithms that are ...
We conjecture that good column-based placements can be produced by minimizing two wire crossing numb...
Abstract — This article describes an algorithm for curvilinear detailed routing. We significantly im...
The growing impact of process variation on circuit performance requires statistical design approache...