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Test suites for embedded systems are typically created from scratch using different, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating the test specification process. Making use of patterns, complex test objectives are covered with lower effort and test cases contain fewer design errors. 1 Test Specification for Embedded Systems 1 A reasonable and potentially succesful test specification method for embedded systems implies understanding of the system under test (SUT) and the test engineering areas. For that purpose we firstly characterise the domain of embedded systems according to our knowledge and then we introduce the methods and test patterns for testing them. Our goal is to support the dynamic black-box software testing. 1.1 Testing within the Embedded Systems Domain Software in embedded systems is gradually becoming of even higher importance than hardware [SZ06] due to the creation of new innovative functions based on software and due to the implementation of formerly mechanically or electronically integrated functions in embedded software. The definition of embedded systems has often been a source of misunderstanding among experts. Relating to such systems we mean mainly embedded software of a certain functional complexity, presenting hybrid behaviour (due to continuous and discrete signals) and constrained by temporal conditions. Addi