As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the voltage drop variations of on-chip power grid networks, considering both wire and log-normal leakage current variations. The new analysis is based on the Hermite polynomial chaos (PC) representation of random processes. Different from the existing Hermite PC based method for power grid analysis, which considers only wire variations and model all the random variations as Gaussian processes. The new method consider both wire variations and leakage current variations. We models the variational sub-threshold leakage currents as log-normal distribution random variables. Our ex...
This paper presents a systematic approach for the statistical simulation of nonlinear networks with ...
This paper proposes a decoupled and iterative circuit implementation of the stochastic Galerkin meth...
Statistical Vt variations lead to large variations of leakage current, which cause statistical volta...
Abstract—This paper proposes a novel stochastic method for analyzing the voltage drop variations of ...
In this paper, we investigate the impact of interconnect and de-vice process variations on voltage f...
With the aggressive scaling down of semiconductor VLSI devicesfrom 65nm to 45 nm, 32nm, the process ...
This dissertation presents stochastics-based methods enabling testing related to three different asp...
Due to the statistical uncertainty of loads and power sources found in smart grids, effective comput...
In this paper, we present a novel statistical full-chip leak-age power analysis method. The new meth...
Polynomial chaos (PC)-based techniques recently became popular alternatives for the stochastic analy...
This paper provides an overview of the polynomial chaos (PC) technique applied to the statistical an...
This paper presents a numerical procedure for the calculation of the polynomial chaos (PC)-expansion...
This paper provides and compares two alternative solutions for the simulation of cables and intercon...
This paper provides and compares two alternative solutions for the sim-4 ulation of cables and inter...
In this paper, the authors apply a surrogate model-based method for probabilistic power flow (PPF) i...
This paper presents a systematic approach for the statistical simulation of nonlinear networks with ...
This paper proposes a decoupled and iterative circuit implementation of the stochastic Galerkin meth...
Statistical Vt variations lead to large variations of leakage current, which cause statistical volta...
Abstract—This paper proposes a novel stochastic method for analyzing the voltage drop variations of ...
In this paper, we investigate the impact of interconnect and de-vice process variations on voltage f...
With the aggressive scaling down of semiconductor VLSI devicesfrom 65nm to 45 nm, 32nm, the process ...
This dissertation presents stochastics-based methods enabling testing related to three different asp...
Due to the statistical uncertainty of loads and power sources found in smart grids, effective comput...
In this paper, we present a novel statistical full-chip leak-age power analysis method. The new meth...
Polynomial chaos (PC)-based techniques recently became popular alternatives for the stochastic analy...
This paper provides an overview of the polynomial chaos (PC) technique applied to the statistical an...
This paper presents a numerical procedure for the calculation of the polynomial chaos (PC)-expansion...
This paper provides and compares two alternative solutions for the simulation of cables and intercon...
This paper provides and compares two alternative solutions for the sim-4 ulation of cables and inter...
In this paper, the authors apply a surrogate model-based method for probabilistic power flow (PPF) i...
This paper presents a systematic approach for the statistical simulation of nonlinear networks with ...
This paper proposes a decoupled and iterative circuit implementation of the stochastic Galerkin meth...
Statistical Vt variations lead to large variations of leakage current, which cause statistical volta...