Abstract * In this paper we introduce a new test-data compression method for IP cores with unknown structure. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Specifically, three different kinds of information are compressed using the same Huffman code, and thus significant test data reductions are achieved. A simple architecture is proposed for decoding on-chip the compressed data. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test se...
Test data compression is an effective methodology for reducing test data volume and testing time. Th...
AbstractTest data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing...
This thesis presents a methodology for achieving high test data compression efficiency by extracting...
Abstract—A new test-data compression method suitable for cores of unknown structure is introduced in...
As system-on-chip (SoC) integration is growing very rapidly, increased circuit densities in SoC have...
Abstract—Selective Huffman coding has recently been proposed for efficient test-data compression wit...
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addit...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
Test data compression is an efficient method for reducing the test application cost. The problem of ...
textHuffman coding is a good method for statistically compressing test data with high compression ra...
This paper presents a new test data compression technique based on a compressioncode that uses exact...
This paper presents a test input data compression technique, which can be used to reduce input test ...
SUMMARY Test compression / decompression is an efficient method for reducing the test application co...
We present a new test data compression and decompression architecture based on a novel and efficient...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
Test data compression is an effective methodology for reducing test data volume and testing time. Th...
AbstractTest data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing...
This thesis presents a methodology for achieving high test data compression efficiency by extracting...
Abstract—A new test-data compression method suitable for cores of unknown structure is introduced in...
As system-on-chip (SoC) integration is growing very rapidly, increased circuit densities in SoC have...
Abstract—Selective Huffman coding has recently been proposed for efficient test-data compression wit...
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addit...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
Test data compression is an efficient method for reducing the test application cost. The problem of ...
textHuffman coding is a good method for statistically compressing test data with high compression ra...
This paper presents a new test data compression technique based on a compressioncode that uses exact...
This paper presents a test input data compression technique, which can be used to reduce input test ...
SUMMARY Test compression / decompression is an efficient method for reducing the test application co...
We present a new test data compression and decompression architecture based on a novel and efficient...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
Test data compression is an effective methodology for reducing test data volume and testing time. Th...
AbstractTest data compression is a major scenario in all system-on-a-chip (SOC) designs for reducing...
This thesis presents a methodology for achieving high test data compression efficiency by extracting...