In this paper, we present a new technique to calculate the power dissipation profile from the IC temperature map using an analogy with image processing and restoration. In this technique, finite element analysis (FEA) is used to find the heat point spread function of the IC chip. Then, the temperature map is used as input for an efficient image restoration algorithm which locates the sources of strong power dissipation non-uniformities. Therefore, for the first time we optimally solve the inverse heat transfer problem, and estimate the IC power map without involving extensive lab experiments. Our computationally efficient and robust method, unlike some previous techniques in the literature, is applicable to virtually any experimental scenar...
Thermal analysis is essential in 3D-IC technology due to the reduced footprint and higher power dens...
A new algorithm is found and a computer program developed for the more exact calculati...
A new algorithm is found and a computer program developed for the more exact calculati...
Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920)Internat...
Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920)Internat...
International audienceAs the feature size decrease with each process generation, and nominal SoC des...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
One of the crucial steps in the design of an integrated circuit is the minimization of heating and t...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
A complete four-dimensional solution T(x, y, z, t) to the classical dynamic heat-flow equation, for ...
Power blurring has been developed to calculate temperature profiles in VLSI ICs, in both steady-stat...
Static and dynamic hot spots limit the performance and reliability of electronic devices and ICs. We...
Thermal analysis is essential in 3D-IC technology due to the reduced footprint and higher power dens...
Thermal analysis is essential in 3D-IC technology due to the reduced footprint and higher power dens...
A new algorithm is found and a computer program developed for the more exact calculati...
A new algorithm is found and a computer program developed for the more exact calculati...
Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920)Internat...
Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920)Internat...
International audienceAs the feature size decrease with each process generation, and nominal SoC des...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
One of the crucial steps in the design of an integrated circuit is the minimization of heating and t...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
International audienceThis paper deals with the problem of measurement of the losses in Power GaN ch...
A complete four-dimensional solution T(x, y, z, t) to the classical dynamic heat-flow equation, for ...
Power blurring has been developed to calculate temperature profiles in VLSI ICs, in both steady-stat...
Static and dynamic hot spots limit the performance and reliability of electronic devices and ICs. We...
Thermal analysis is essential in 3D-IC technology due to the reduced footprint and higher power dens...
Thermal analysis is essential in 3D-IC technology due to the reduced footprint and higher power dens...
A new algorithm is found and a computer program developed for the more exact calculati...
A new algorithm is found and a computer program developed for the more exact calculati...