... reseeding architecture is the limited seed efficiency due to the variance in the number of specified bits per vector. This paper proposes a new LFSR reseeding architecture that essentially solves this problem, resulting in a significant compression ratio. The compression ratio is very close to the entropy in terms of #total bits / #specified bits. The technique is applied on two industrial designs resulting in a compression ratio of 33x (with a seed efficiency of 95%), whereas the conventional reseeding architecture resulted in only 2x (with a seed efficiency of only 50%)
. In this paper we perform a comparative analysis of the encoding efficiency of BIST schemes based o...
Reseeding is used to improve fault coverage of pseudo-random testing. The seed corresponds to the in...
Abstract — Although LFSR reseeding based on test cubes for modeled faults is an efficient test compr...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
Solving a system of linear equations has been widely used to compute seeds for LFSR reseeding to com...
Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. Howe...
Abstract—This paper presents a new low-power test-data-compression scheme based on linear feedback s...
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improv...
In testing there are two primary domains one is reducing input test data volume and next is reducing...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
textThis dissertation considers the problem of reducing the storage as well as the bandwidth (data ...
An approach for input data compaction in the testing of circuits using scan and partial scan has rec...
In this paper we perform a comparative analysis of the encoding efficiency of BIST schemes based on ...
A comparative analysis of the encoding efficiency of built-in-self-test (BIST) schemes based on rese...
. In this paper we perform a comparative analysis of the encoding efficiency of BIST schemes based o...
Reseeding is used to improve fault coverage of pseudo-random testing. The seed corresponds to the in...
Abstract — Although LFSR reseeding based on test cubes for modeled faults is an efficient test compr...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
Solving a system of linear equations has been widely used to compute seeds for LFSR reseeding to com...
Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. Howe...
Abstract—This paper presents a new low-power test-data-compression scheme based on linear feedback s...
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improv...
In testing there are two primary domains one is reducing input test data volume and next is reducing...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
textThis dissertation considers the problem of reducing the storage as well as the bandwidth (data ...
An approach for input data compaction in the testing of circuits using scan and partial scan has rec...
In this paper we perform a comparative analysis of the encoding efficiency of BIST schemes based on ...
A comparative analysis of the encoding efficiency of built-in-self-test (BIST) schemes based on rese...
. In this paper we perform a comparative analysis of the encoding efficiency of BIST schemes based o...
Reseeding is used to improve fault coverage of pseudo-random testing. The seed corresponds to the in...
Abstract — Although LFSR reseeding based on test cubes for modeled faults is an efficient test compr...