Three-dimensional integrated circuits (3D ICs) provide an attractive solution for improving circuit performance. Such solutions must be embedded in an electrothermally-conscious design methodology, since 3D ICs generate a significant amount of heat per unit volume. In this paper, we propose a temperature-aware 3D global routing algorithm with insertion of “thermal vias ” and “thermal wires ” to lower the effective thermal resistance of the material, thereby reducing chip temperature. Since thermal vias and thermal wires take up lateral routing space, our algorithm utilizes sensitivity analysis to judiciously allocate their usage, and iteratively resolve contention between routing and thermal vias and thermal wires. Experimental results show...
With the development of IC technology, 3 dimensional (3D) architecture (3D IC) has been proposed as ...
As the technology progresses, interconnect delays have become bottlenecks of chip performance. Three...
Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC t...
Due to the tier architecture of 3D network-on-chip (3D-NoC), reducing the thermal hotspot within the...
Heat dissipation is one of the most serious challenges in 3D IC designs. One e#ective way of reducin...
The recent popularity of 3D IC technology stems from its enhanced performance capabilities and reduc...
In this paper, we present the Immediate Neighbourhood Temperature (INT) routing algorithm which bala...
With the rapid advance of enabling technologies, the era of 3D ICs is near. Yet, there are several p...
Three dimensional (3D) integration technologies have a smaller footprint area of chip compared to th...
Abstract-Due to the increased power density and lower thermal conductivity, 3D is faced with heat di...
Abstract. In current reconfigurable architectures, the interconnect structures increasingly contribu...
As the technology progresses, interconnect delays have become bottlenecks of chip performance. Three...
Abstract—To reduce interconnect delay and improve chip performance, three-dimensional chip emerges w...
Abstract: Thermal issue is a critical challenge in 3D IC circuit design. Incorporating thermal vias ...
The recent popularity of 3D IC technology stems from its enhanced performance capabilities and reduc...
With the development of IC technology, 3 dimensional (3D) architecture (3D IC) has been proposed as ...
As the technology progresses, interconnect delays have become bottlenecks of chip performance. Three...
Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC t...
Due to the tier architecture of 3D network-on-chip (3D-NoC), reducing the thermal hotspot within the...
Heat dissipation is one of the most serious challenges in 3D IC designs. One e#ective way of reducin...
The recent popularity of 3D IC technology stems from its enhanced performance capabilities and reduc...
In this paper, we present the Immediate Neighbourhood Temperature (INT) routing algorithm which bala...
With the rapid advance of enabling technologies, the era of 3D ICs is near. Yet, there are several p...
Three dimensional (3D) integration technologies have a smaller footprint area of chip compared to th...
Abstract-Due to the increased power density and lower thermal conductivity, 3D is faced with heat di...
Abstract. In current reconfigurable architectures, the interconnect structures increasingly contribu...
As the technology progresses, interconnect delays have become bottlenecks of chip performance. Three...
Abstract—To reduce interconnect delay and improve chip performance, three-dimensional chip emerges w...
Abstract: Thermal issue is a critical challenge in 3D IC circuit design. Incorporating thermal vias ...
The recent popularity of 3D IC technology stems from its enhanced performance capabilities and reduc...
With the development of IC technology, 3 dimensional (3D) architecture (3D IC) has been proposed as ...
As the technology progresses, interconnect delays have become bottlenecks of chip performance. Three...
Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC t...