Add to ORKGIn this paper an overview of the uncertainty in the results obtained with the histogram test of Analog to Digital Converters is presented. The effect of phase noise, input equivalent additive noise and random phase difference on the number of counts of the cumulative histogram is shown. Theoretical and experimental results are presented. I
Abstract — The jitter test of analog to digital converters is traditionally carried out with one of ...
Abstract – One method to characterize ADCs is to use a histogram, where Gaussian noise may be used a...
International audienceImprovements on electronic technology in recent years have allowed th...
Abstract: We present here expressions to determine the uncertainty interval of the estimates of tran...
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
Abstract—In this paper, the uncertainty of the estimated stan-dard deviation of the random noise pre...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
Abstract − The presence of additive noise in an analogue to digital converter test setup or in the c...
In the last years, many Authors have dealt with the uncertainty evaluation of the measurement perfor...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converter...
Abstract-This paper addresses the uncertainty of the estimates of ADC testing obtained with the Hist...
Abstract — The jitter test of analog to digital converters is traditionally carried out with one of ...
Abstract – One method to characterize ADCs is to use a histogram, where Gaussian noise may be used a...
International audienceImprovements on electronic technology in recent years have allowed th...
Abstract: We present here expressions to determine the uncertainty interval of the estimates of tran...
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
Abstract—In this paper, the uncertainty of the estimated stan-dard deviation of the random noise pre...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
Abstract − The presence of additive noise in an analogue to digital converter test setup or in the c...
In the last years, many Authors have dealt with the uncertainty evaluation of the measurement perfor...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converter...
Abstract-This paper addresses the uncertainty of the estimates of ADC testing obtained with the Hist...
Abstract — The jitter test of analog to digital converters is traditionally carried out with one of ...
Abstract – One method to characterize ADCs is to use a histogram, where Gaussian noise may be used a...
International audienceImprovements on electronic technology in recent years have allowed th...