Temperature and Voltage Scaling Effects on Electrical Masking

Abstract — Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on memory elements. Recent works have looked at modeling and estimating soft errors in logic circuits. Increased power consumption with very dense circuits has led to large number of hot spots in present day ICs. Voltage scaling is one of the popular techniques used for power reduction in circuits. This work presents the results from a study of effects of both increased temperature and voltage scaling on electrical masking effect in logic circuits