Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers clearly require accurate estimates of processor error rates to make appropriate cost/reliability trade-offs. This paper describes a method for generating these estimates. A key aspect of this analysis is that some single-bit faults (such as those occurring in the branch predictor) will not produce an error in a program's output. We define a structure's architectural vulnerability factor (AVF) as the probability that a fault in that particular structure will result in an error. A structure's error rate is the product of its raw error rate, as determi...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
textReliability has emerged as a first class design concern, as a result of an exponential increase...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Early reliability assessment of hardware structures using microarchitecture level simulators can eff...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
textReliability has emerged as a first class design concern, as a result of an exponential increase...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Early reliability assessment of hardware structures using microarchitecture level simulators can eff...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
textReliability has emerged as a first class design concern, as a result of an exponential increase...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...