Abstract — We propose a fine-grained scheme to compensate for within-die variations in dynamic logic to reduce the variation in leakage, delay and noise margin through body-biasing. We first show that the amount of body-bias compensation needed depends on the correlation that exists between gates, and then analytically show the possible reduction in the variance of the leakage of both a single and multiple dynamic logic gates. We then design a circuit to implement the system which provides the reduction in the variance of the leakage, delay and noise margin of dynamic logic gates and show that it produces a close match to the analytical results. In our design, the variance of a typical test circuit is reduced by 27 % and the variance of the...
Technology scaling improves the energy, performance, and area of the digital circuits. With further ...
With the technology process scaling, leakage power dissipation is becoming a growing number of perce...
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum spe...
[[abstract]]As fabrication technology progresses, several new challenges follow. Among them, the mos...
The most critical concern in circuit is to achieve high level of performance with very tight power c...
[[abstract]]In recent years, fabrication technology of CMOS has scaled to nanometer dimensions. As s...
Abstract-Leakage current is susceptible to variation of transistor parameters and environment such a...
ABSTRACT Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of indi...
All digital circuits have design margins for delay and power consumption. This thesis introduces an ...
Parameter variation is detrimental to a processor's frequency and leakage power. One proposed techni...
Local variations are increasingly important in new technologies. This paper presents the design of a...
Journal ArticleDynamic logic can provide significant performance and power benefit compared to impl...
We present techniques to determine the optimal body bias (forward or reverse) to minimize leakage cu...
textAs we scale down each process generation the degree of control we have on device parameters decr...
Noise is becoming a major concern in digital systems due to the insistent scaling development in dev...
Technology scaling improves the energy, performance, and area of the digital circuits. With further ...
With the technology process scaling, leakage power dissipation is becoming a growing number of perce...
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum spe...
[[abstract]]As fabrication technology progresses, several new challenges follow. Among them, the mos...
The most critical concern in circuit is to achieve high level of performance with very tight power c...
[[abstract]]In recent years, fabrication technology of CMOS has scaled to nanometer dimensions. As s...
Abstract-Leakage current is susceptible to variation of transistor parameters and environment such a...
ABSTRACT Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of indi...
All digital circuits have design margins for delay and power consumption. This thesis introduces an ...
Parameter variation is detrimental to a processor's frequency and leakage power. One proposed techni...
Local variations are increasingly important in new technologies. This paper presents the design of a...
Journal ArticleDynamic logic can provide significant performance and power benefit compared to impl...
We present techniques to determine the optimal body bias (forward or reverse) to minimize leakage cu...
textAs we scale down each process generation the degree of control we have on device parameters decr...
Noise is becoming a major concern in digital systems due to the insistent scaling development in dev...
Technology scaling improves the energy, performance, and area of the digital circuits. With further ...
With the technology process scaling, leakage power dissipation is becoming a growing number of perce...
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum spe...