Add to ORKGThe paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test are decompressed by reusing scan chains of cores idle during that time. The method only requires a few additional gates in the wrapper, while the mission logic is untouched. Storage and bandwidth requirements for the ATE are reduced significantly. Keywords: System-on-a-Chip, Embedded Test, BIST
Synchronization overhead between the core under test and the automatic test equipment is the main dr...
This paper presents a new test data compression technique based on a compressioncode that uses exact...
For system-on-chip designs that contain an embedded processor, this paper present a software based d...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
We present a data compression method and decompres-sion architecture for testing embedded cores in a...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Abstract.We present a new decompression architecture suitable for embedded cores in SoCs which focus...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
We describe a built-in test pattern generation method for scan circuits. The method is based on part...
AbstractPresent complexity of System on Chip (SoC) design is increasing rapidly in the number of tes...
Synchronization overhead between the core under test and the automatic test equipment is the main dr...
This paper presents a new test data compression technique based on a compressioncode that uses exact...
For system-on-chip designs that contain an embedded processor, this paper present a software based d...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
We present a data compression method and decompres-sion architecture for testing embedded cores in a...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Abstract.We present a new decompression architecture suitable for embedded cores in SoCs which focus...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
We describe a built-in test pattern generation method for scan circuits. The method is based on part...
AbstractPresent complexity of System on Chip (SoC) design is increasing rapidly in the number of tes...
Synchronization overhead between the core under test and the automatic test equipment is the main dr...
This paper presents a new test data compression technique based on a compressioncode that uses exact...
For system-on-chip designs that contain an embedded processor, this paper present a software based d...