Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designers to address the issue of reliable operation in the presence of hard-faults. Virtually all previous work on hard-fault reliability addresses problems that arise when a fault occurs in architectural resources, such as the register file or caches. However, hard-faults can happen in non-architectural resources, such as predictors and replacement bits. Although non-architectural hard-faults do not affect correctness they can degrade a processor performance significantly and, therefore, may render them as important to deal with as architectural hard-faults. In this paper we determine, using previously proposed hard-fault models, the temperature c...
This paper presents a first-order analytical model for determining the performance degradation cause...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
As the limits of computer technology are pushed into the domains of the very small, the very cheap, ...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. ...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Processor reliability at upcoming technology nodes presents significant challenges to designers from...
Abstract: Memory testing in general, and DRAM testing in particular, has become greatly dependent on...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
This paper presents a first-order analytical model for determining the performance degradation cause...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
As the limits of computer technology are pushed into the domains of the very small, the very cheap, ...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. ...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Processor reliability at upcoming technology nodes presents significant challenges to designers from...
Abstract: Memory testing in general, and DRAM testing in particular, has become greatly dependent on...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
This paper presents a first-order analytical model for determining the performance degradation cause...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
As the limits of computer technology are pushed into the domains of the very small, the very cheap, ...