Abstract. The effects of variations in the workload input when estimating error detection coverage using fault injection are investigated. Results from scanchain implemented fault injection experiments using the FIMBUL tool on the Thor microprocessor show that the estimated error non-coverage may vary by more than five percentage units for different workload input sequences. A methodology for predicting error coverage for a particular input sequence based on results from fault injection experiments with another input sequence is presented. The methodology is based on the fact that workload input variations alter the usage of sensitive data and cause different parts of the workload code to be executed different number of times. By using the ...
The one of the most outstanding features of a digital I&C system is the use of a fault-tolerant ...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
We present an analytical technique that uses fault injection data for estimating the coverage of con...
In this thesis we present two prediction techniques for estimating the error coverage of target prog...
Measuring the error sensitivity by fault injection is an important method for assessing the dependab...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
International audienceThis paper presents two error models to evaluate safety of a software error de...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
99 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.This thesis demonstrates a pra...
Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as...
It is well known that workload has significant impact on dependability measures obtained from fault ...
Aspect‐oriented programming provides an interesting approach for implementing software‐based fault t...
The one of the most outstanding features of a digital I&C system is the use of a fault-tolerant ...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
We present an analytical technique that uses fault injection data for estimating the coverage of con...
In this thesis we present two prediction techniques for estimating the error coverage of target prog...
Measuring the error sensitivity by fault injection is an important method for assessing the dependab...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
International audienceThis paper presents two error models to evaluate safety of a software error de...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
99 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.This thesis demonstrates a pra...
Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as...
It is well known that workload has significant impact on dependability measures obtained from fault ...
Aspect‐oriented programming provides an interesting approach for implementing software‐based fault t...
The one of the most outstanding features of a digital I&C system is the use of a fault-tolerant ...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...