Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the effects of variations. The FPGA community on the other hand, has only recently started focussing on the effects of variations. This paper presents a comparative study of the impact of variations on designs mapped to FPGAs and ASICs to get a measure of the severity of the problem in both the FPGA and ASIC domains. We also propose a variation aware router that reduces the yield loss by 7.61X, or the circuit delay by 3.95 % for the same yield for the MCNC benchmarks. 1
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...
Parameter variations, which are increasing along with advances in process technologies, affect both...
A fundamental difference between ASICs and FPGAs is that wires in ASICs are designed such that it ma...
ABSTRACT Chip design in the nanometer regime is becoming increasingly difficult due to process varia...
iii As feature sizes scale toward atomic limits, parameter variation continues to increase, leading ...
This thesis proposes optimisation methods for improving the timing performance of digital circuits ...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
Continued miniaturization of semiconductor technology to nanoscale dimensions has elevated reliabili...
Abstract — Meeting the tight performance specifications mandated by the customer is critical for con...
As feature sizes scale toward atomic limits, parameter variation continues to increase, leading to i...
Abstract—As semiconductor manufacturing continues towards reduced feature sizes, yield loss due to p...
A reconfiguralbe device can be utilized to enhance speed and yield on the sub-100nm device technolog...
Integrated circuit design is limited by manufacturability. As devices scale down, sensitivity to pro...
Continued technology scaling has enabled the tremendous growth that semi-conductor industry has witn...
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...
Parameter variations, which are increasing along with advances in process technologies, affect both...
A fundamental difference between ASICs and FPGAs is that wires in ASICs are designed such that it ma...
ABSTRACT Chip design in the nanometer regime is becoming increasingly difficult due to process varia...
iii As feature sizes scale toward atomic limits, parameter variation continues to increase, leading ...
This thesis proposes optimisation methods for improving the timing performance of digital circuits ...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
Continued miniaturization of semiconductor technology to nanoscale dimensions has elevated reliabili...
Abstract — Meeting the tight performance specifications mandated by the customer is critical for con...
As feature sizes scale toward atomic limits, parameter variation continues to increase, leading to i...
Abstract—As semiconductor manufacturing continues towards reduced feature sizes, yield loss due to p...
A reconfiguralbe device can be utilized to enhance speed and yield on the sub-100nm device technolog...
Integrated circuit design is limited by manufacturability. As devices scale down, sensitivity to pro...
Continued technology scaling has enabled the tremendous growth that semi-conductor industry has witn...
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...
Parameter variations, which are increasing along with advances in process technologies, affect both...
A fundamental difference between ASICs and FPGAs is that wires in ASICs are designed such that it ma...