Static Analysis Support for Measurement-based WCET Analysis

Guaranteeing that the worst-case scenario has been covered for each basic block individually is a major challenge in measurement-based WCET analysis. On the static analysis side the accuracy of hardware models used are also subject to doubt as they are based on available documentation provided by vendors which may be not detailed enough nor correct or both. Even for verified models the question remains whether subsequent chips adhere to the same specification. We introduce a new approach to enhance measurement-based WCET analysis by deploying static analysis to ensure test coverage on basic block level and reduce pessimism. In particular, our work focuses on the questions how detailed does the hardware specification have to be to make the measurements trustworthy