ILITY, CONCENTRATING ON GATE LENGTH AND ON-CHIP TEMPERATURE VARIATIONS. TO ASSESS THE EFFECT OF MICROARCHITECTURE DECISIONS ON THESE VARIATIONS, AND VICE VERSA, THEY PROPOSE A JOINT PERFORMANCE, POWER, AND VARIABILITY METRIC THAT DISTINGUISHES AMONG VARIOUS DESIGN CHOICES. ENERGY AWARENESS AND UNCERTAINTY IN MICROARCHITECTURE-LEVEL DESIGN Published by the IEEE Computer Society 0272-1732/05/$20.00 # 2005 IEEE adaptive body biasing and adaptive voltage supply to increase the highest-frequency bins and thus reduce clock speed variability. However, many decisions made at the microarchitecture level affect design variability, while also significantly affecting the design's overall performance and power profile. This is especial...
Faced with the challenge of finding ways to use an ever-growing transistor budget, microarchitects h...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
Abstract—Aggressive device size scaling combined with Vdd and Vth scaling lead to increasing circuit...
This paper proposes microarchitecture-level models for Within Die (WID) process and system parameter...
Parameter variations, which are increasing along with advances in process technologies, affect both...
Continued technology scaling has enabled the tremendous growth that semi-conductor industry has witn...
As integrated-circuit technology continues to scale, process variation is becoming an issue that can...
Abstract — This paper presents methods for addressing two sources of variability in the context of m...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
emerged as a major constraint in the design of microprocessors. At the low end of the performance sp...
Efficient power management is becoming increasingly important with the rapid growth of portable, wir...
Power has become an important aspect in the design of general purpose processors. This thesis explor...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large incre...
Abstract—Variation-aware design involves designing circuits tolerant to process and temperature vari...
Faced with the challenge of finding ways to use an ever-growing transistor budget, microarchitects h...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
Abstract—Aggressive device size scaling combined with Vdd and Vth scaling lead to increasing circuit...
This paper proposes microarchitecture-level models for Within Die (WID) process and system parameter...
Parameter variations, which are increasing along with advances in process technologies, affect both...
Continued technology scaling has enabled the tremendous growth that semi-conductor industry has witn...
As integrated-circuit technology continues to scale, process variation is becoming an issue that can...
Abstract — This paper presents methods for addressing two sources of variability in the context of m...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
emerged as a major constraint in the design of microprocessors. At the low end of the performance sp...
Efficient power management is becoming increasingly important with the rapid growth of portable, wir...
Power has become an important aspect in the design of general purpose processors. This thesis explor...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large incre...
Abstract—Variation-aware design involves designing circuits tolerant to process and temperature vari...
Faced with the challenge of finding ways to use an ever-growing transistor budget, microarchitects h...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
Abstract—Aggressive device size scaling combined with Vdd and Vth scaling lead to increasing circuit...