VLSI design optimization requires evaluation of di#erent solutions, to compare superiority of one over the other. Typically, a solution is superior if it has a better associated timing and cost. In the presence of fabrication variability, the timing and cost of a solution become random variables with spatial and functional correlations. Therefore the evaluation of solutions shall be performed probabilistically to determine the probability that a solution has better cost and timing. In this paper we propose and evaluate three methods for fast and accurate probabilistic comparison of solutions: 1) regular Monte Carlo simulation (as a basis of comparison), 2) joint-pdf approximation using moment matching, and 3) bound-based Conditional Monte C...
textThe increased variability of process and environmental parameters is having a significant impac...
The intrinsic variability of nanoscale VLSI technology must be taken into account when analyzing cir...
This thesis presents a new technique for simulating integrated circuits, called probabilistic simula...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
Increasing levels of process variability in sub-100nm CMOS design has become a critical concern for ...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
Abstract-The growing demand in the multimedia rich applications are motivating the low-power and hig...
Given a Directed Acyclic Graph and different possible implementations for each node, the Implementat...
Semiconductor technology has gone through several decades of aggressive scaling. The ever shrinking ...
The performance of integrated circuits (IC) is becoming less predictable as technology scales to the...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
With the increased significance of leakage power and performance variability, the yield of a design ...
Vita.This dissertation deals with both theoretical and practical aspects of integrated circuits (IC'...
textThe increased variability of process and environmental parameters is having a significant impac...
The intrinsic variability of nanoscale VLSI technology must be taken into account when analyzing cir...
This thesis presents a new technique for simulating integrated circuits, called probabilistic simula...
Today's IC design is facing several challenges due to increasing circuit complexity and decreasing f...
Increasing levels of process variability in sub-100nm CMOS design has become a critical concern for ...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
Abstract-The growing demand in the multimedia rich applications are motivating the low-power and hig...
Given a Directed Acyclic Graph and different possible implementations for each node, the Implementat...
Semiconductor technology has gone through several decades of aggressive scaling. The ever shrinking ...
The performance of integrated circuits (IC) is becoming less predictable as technology scales to the...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
With the increased significance of leakage power and performance variability, the yield of a design ...
Vita.This dissertation deals with both theoretical and practical aspects of integrated circuits (IC'...
textThe increased variability of process and environmental parameters is having a significant impac...
The intrinsic variability of nanoscale VLSI technology must be taken into account when analyzing cir...
This thesis presents a new technique for simulating integrated circuits, called probabilistic simula...