Add to ORKGThe increasing transient fault rate will necessitate on-chip fault tolerance techniques in future processors. The speed gap between the processor and the memory is also increasing, causing the processor to stay idle for hundreds of cycles while waiting for a long-latency cache miss to be serviced. Even in the presence of aggressive prefetching techniques, future processors are expected to waste significant processing bandwidth waiting for main memory
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
: Introspection, a zero-overhead binding technique during self-diagnosing microarchitecture synthesi...
The current trends in technology, fabrication processes, and computing architectures are increasingl...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors de...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
Nearly every synchronous digital circuit today is de-signed with timing margins. These timing margin...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
: Introspection, a zero-overhead binding technique during self-diagnosing microarchitecture synthesi...
The current trends in technology, fabrication processes, and computing architectures are increasingl...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors de...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
Nearly every synchronous digital circuit today is de-signed with timing margins. These timing margin...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...