of the Thesis Presented in Partial Fulfillment of the Requirements for the Degree of Master of Science (in Electrical Engineering) Aug. 1997 This thesis describes a new method for developing ADC error function models using standard sinewave histogram methods. The histograms supply information to accurately estimate expected error for each ADC output code. The method provides better error representation by providing error basis functions for every output code. Results show this method is capable of removing all slope dependent errors in complex ADC error models and application to a 200 MSPS ADC showed more than 10 dB improvement in SFDR over the full nyquist band for the ADC. ACKNOWLEDGMENTS This work has been supported in part by the ARPA ...
5-th International Symposium on Electrical Measuring Intruments for Low and Medium Frequencie
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Theoretically time interleaved analog-to-digital converters (TI-ADCs) offer a technologically feasib...
A method for correcting matching errors in an ADC is presented. The method uses the unknown input da...
Abstract. The histogram method is a very classical test technique for Analog to Digital Converters (...
The accuracy of AD converters can be improved by error correction. The presented ADC analyzer and ca...
Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method r...
Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
Abstract − The progress in the technology of the analogue to digital converters (ADCs) suppresses th...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
<div><p>Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based ...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
A new definition is proposed for the effective number of bits of an ADC. This definition removes the...
This paper proposes a novel histogram BIST scheme for ADC static testing. For a monotonic ADC, the o...
5-th International Symposium on Electrical Measuring Intruments for Low and Medium Frequencie
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Theoretically time interleaved analog-to-digital converters (TI-ADCs) offer a technologically feasib...
A method for correcting matching errors in an ADC is presented. The method uses the unknown input da...
Abstract. The histogram method is a very classical test technique for Analog to Digital Converters (...
The accuracy of AD converters can be improved by error correction. The presented ADC analyzer and ca...
Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method r...
Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
Abstract − The progress in the technology of the analogue to digital converters (ADCs) suppresses th...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
<div><p>Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based ...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
A new definition is proposed for the effective number of bits of an ADC. This definition removes the...
This paper proposes a novel histogram BIST scheme for ADC static testing. For a monotonic ADC, the o...
5-th International Symposium on Electrical Measuring Intruments for Low and Medium Frequencie
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Theoretically time interleaved analog-to-digital converters (TI-ADCs) offer a technologically feasib...