Parallel Computation of Delay Fault Probabilities

This paper presents an improved measure for the dynamic functionality of a logic circuit, called delay fault probability (DFP). The new measure reflects both the nominal delay of the paths and the fact that only few paths are critical for path delay fault testing. An efficient distributed algorithm for computing DFP is presented. The experimental results show that, in contrast to DFP, the conventional fault coverage is an inadequate criterion to assure the dynamic functionality of a circuit