Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it difficult to trade between the level of data integrity and the chip area requirement. We focus on transient fault tolerance in primary cache memories and develop new architectural solutions to maximize fault coverage when the budgeted silicon area is not sufficient for the conventional configuration of an error checking code. The underlying idea is to exploit the corollary of reference locality in the organization and management of the code. A higher protection priority is dynamically assigned to the portions of the cache that are more error-prone and have a highe...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
Information integrity in cache memories is a fundamen-tal requirement for dependable computing. Conv...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
Information integrity in cache memories is a fundamen-tal requirement for dependable computing. Conv...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...