In this paper we propose a new hybrid (logic+I DDQ ) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I DDQ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I DDQ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I DDQ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I DDQ ) test set with very few I DDQ vectors. 1 Introduction Due to the high integration density of VLSI circuits, bridging faults (a physical de...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
Download Citation Email Print Request Permissions Feedback bridging faults may giv...
In this paper we give an overview of recent work in extraction, simulation, and IDDQ test generation...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
An efficient automatic test pattern generator for I$\sb{DDQ}$ current testing of CMOS digital circui...
This paper analyzes the detectability of resistive bridging faults in CMOS (micro)-pipelined circuit...
[[abstract]]This paper presents the BIFEST, an ATPG system that combines the conventional ATPG proce...
122 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Finally, we present a diagnos...
The growing dispersion of ICs' parameters poses relevant uncertainties on gate output conductances...
Due to the character of the original source materials and the nature of batch digitization, quality ...
[[abstract]]This paper presents BIFEST, an ATPG system that employs the built-in intermediate voltag...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
For the past 40 years, Moore\u27s Law---which describes the unrelenting improvement in CMOS technolo...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
Download Citation Email Print Request Permissions Feedback bridging faults may giv...
In this paper we give an overview of recent work in extraction, simulation, and IDDQ test generation...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
An efficient automatic test pattern generator for I$\sb{DDQ}$ current testing of CMOS digital circui...
This paper analyzes the detectability of resistive bridging faults in CMOS (micro)-pipelined circuit...
[[abstract]]This paper presents the BIFEST, an ATPG system that combines the conventional ATPG proce...
122 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Finally, we present a diagnos...
The growing dispersion of ICs' parameters poses relevant uncertainties on gate output conductances...
Due to the character of the original source materials and the nature of batch digitization, quality ...
[[abstract]]This paper presents BIFEST, an ATPG system that employs the built-in intermediate voltag...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
For the past 40 years, Moore\u27s Law---which describes the unrelenting improvement in CMOS technolo...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
The reliability of a fault-tolerant circuit may be drastically impaired by the presence of maskable ...
Download Citation Email Print Request Permissions Feedback bridging faults may giv...