Add to ORKGAn accurate delay model has been developed and integrated in a delay-fault test-pattern generator. The approach is based on extensive multi-input logic gate timing characterisation and layout extraction for interconnection wiring delays. The generator is capable of detecting small delay faults in combinational as well as sequential circuits. It provides the optimal observation times for detecting specific delay faults and is not limited to primitive gates. The generator has been used to provide accurate delay-fault tests for an industrial high-speed CPLD requiring all the mentioned features. Keywords--- Delay modelling & characterisation, CPLD testing, delay-fault testing, I. Introduction The increasing clock speed in digital processo...
Technology scaling and manufacturing process affect the performance of digital circuits, making them...
Abstract detection of delay faults is generally reported by showingfault coverage values for commonl...
some design disciplines have been adopted. For example, the level-sensitive scan design discip-line ...
Path selection and generating tests for small delay faults is an important issue in the delay fault ...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
UnrestrictedAs VLSI fabrication process continues to advance and device and interconnect dimensions ...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
This thesis concerns the problem of timing verification and synthesis of circuits for robust delay f...
This paper proposes a novel approach for the generation of test patterns suitable for detecting Gate...
The increasing clock frequencies have led to new fault effects of production defects. These so calle...
An automatic test pattern generation approach todetect delay defects in a circuit consisting of curr...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
Technology scaling and manufacturing process affect the performance of digital circuits, making them...
Abstract detection of delay faults is generally reported by showingfault coverage values for commonl...
some design disciplines have been adopted. For example, the level-sensitive scan design discip-line ...
Path selection and generating tests for small delay faults is an important issue in the delay fault ...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
UnrestrictedAs VLSI fabrication process continues to advance and device and interconnect dimensions ...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
This thesis concerns the problem of timing verification and synthesis of circuits for robust delay f...
This paper proposes a novel approach for the generation of test patterns suitable for detecting Gate...
The increasing clock frequencies have led to new fault effects of production defects. These so calle...
An automatic test pattern generation approach todetect delay defects in a circuit consisting of curr...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
Technology scaling and manufacturing process affect the performance of digital circuits, making them...
Abstract detection of delay faults is generally reported by showingfault coverage values for commonl...
some design disciplines have been adopted. For example, the level-sensitive scan design discip-line ...