The atomic structures and energies of 1/6 < 20¯23> and 1/3 < 10¯10> partial dislocations in wurtzite GaN are modelled using an empirical interatomic potential in combination with topological theory and anisotropic elasticity calculations. Twelve stable configurations of the 1/6 < 20¯23> edge and mixed partial dislocations that bound I1 intrinsic basal stacking faults are obtained for each polarity and their core radii, energies, and atomic configurations are given. Moreover, the 1/3 < 10¯10> edge and mixed partial dislocations along the junction lines between inversion domain boundaries (IDBs) and I1 stacking faults are studied. Twenty eight stable junction line configurations have been identified, sixteen of them re...
The atomic structures and electrical properties for threading screw and threading edge dislocations ...
In this article we review our theoretical work on dislocations in GaN. The methods applied are two d...
The authors have investigated two types of extended defects commonly found in AlN, GaN and InN films...
peer reviewedThe I1 intrinsic basal stacking faults (BSFs) are acknowledged as the principal defects...
A non-singular gradient elasticity solution for the dislocation self-energy is employed and compared...
First-principle calculations have shown that both the partials can be electrically active. In partic...
90° Shockley partial dislocations in GaN are investigated by first-principles calculations. This wor...
International audienceAn atomistic simulation of the threading (a+c) -mixed dislocation core in wurt...
We have carried out computer atomistic simulations, based on an efficient density functional based t...
The atomic structures, electrical properties, and line energies for threading screw and threading ed...
International audienceIn this paper, a new version of the Stillinger–Weber (SW) potential for wurtzi...
The lattice-misfit InN/GaN (0001) interface supports a triangular network of alpha-core 90 degrees p...
International audienceThe $\langle1\bar 100\rangle$ edge dislocation in GaN has been investigated by...
The atomic structures, electrical properties, and line energies for threading screw and threading ed...
The atomic structures and electrical properties for threading screw and threading edge dislocations ...
In this article we review our theoretical work on dislocations in GaN. The methods applied are two d...
The authors have investigated two types of extended defects commonly found in AlN, GaN and InN films...
peer reviewedThe I1 intrinsic basal stacking faults (BSFs) are acknowledged as the principal defects...
A non-singular gradient elasticity solution for the dislocation self-energy is employed and compared...
First-principle calculations have shown that both the partials can be electrically active. In partic...
90° Shockley partial dislocations in GaN are investigated by first-principles calculations. This wor...
International audienceAn atomistic simulation of the threading (a+c) -mixed dislocation core in wurt...
We have carried out computer atomistic simulations, based on an efficient density functional based t...
The atomic structures, electrical properties, and line energies for threading screw and threading ed...
International audienceIn this paper, a new version of the Stillinger–Weber (SW) potential for wurtzi...
The lattice-misfit InN/GaN (0001) interface supports a triangular network of alpha-core 90 degrees p...
International audienceThe $\langle1\bar 100\rangle$ edge dislocation in GaN has been investigated by...
The atomic structures, electrical properties, and line energies for threading screw and threading ed...
The atomic structures and electrical properties for threading screw and threading edge dislocations ...
In this article we review our theoretical work on dislocations in GaN. The methods applied are two d...
The authors have investigated two types of extended defects commonly found in AlN, GaN and InN films...