Analyzing testability from behavioral to RT level

In this paper, we present a method for analyzing the testability of a circuit during high level synthesis. The testability analysis returns values that represent the relative difficulty for computing test data, whatever the level of description of a circuit is (from the behavioral level --initial specification-- down to the Register Transfer Level --high level synthesis output--). Experiments show the good correlation of the so-obtained testability measures with gate-level testability measures (e.g. Scoap). The proposed measures are used to guide high level synthesis towards the generation of easily SATPG testable datapaths