We study the optical properties of tetravalent-vanadium impurities in 4H silicon carbide. Light emission from two crystalline sites is observed at wavelengths of 1.28 and 1.33 mu m, with optical lifetimes of 163 and 43 ns, respectively, which remains stable up to 50 and 20 K, respectively. Moreover, spectrally broad photoluminescence is observed up to room temperature. Group-theory and ab initio density-functional supercell calculations enable unequivocal site assignment and shed light on the spectral features of the defects. Specifically, our numerical simulations indicate that the site assignment is reversed with respect to previous assumptions. Our calculations show that vanadium in silicon carbide has highly favorable properties for the...
The source responsible for V2 (1.398 eV) luminescence in 6H-SiC is recognized as a favorable defect ...
Silicon carbide (SiC) has recently been investigated as an alternative material to host deep optical...
Silicon carbide with engineered point defects is considered as very promising material for the next ...
We study the optical properties of tetravalent-vanadium impurities in 4H silicon carbide. Light emis...
Whereas intrinsic defects in silicon carbide (SiC) have been widely considered for qubit application...
Abstract Spin-active quantum emitters have emerged as a leading platform for quantum technologies. H...
Point defects strongly affect the electrical and optical properties of semiconductors, and are there...
Funding Information: This work has been supported by the Academy of Finland under Project No. 311058...
Trace impurities of vanadium in Lely-grown silicon carbide single crystals have been detected by the...
Defects are common in many materials and some were regarded for years as detrimental. Recently with ...
Typical undoped bulk grown SiC shows n- or p-type conductivity due to residual impurities such as ni...
Color centers in silicon carbide (SiC), such as the negative silicon vacancy (V-Si(-)) and neutral d...
The negatively charged silicon vacancy (V-Si(-)) in silicon carbide is a well-studied point defect f...
Color centers in wide-bandgap semiconductors are attractive systems for quantum technologies since t...
The carbon antisite-vacancy pair (CSiVC) in silicon carbide (SiC) has recently emerged as a promisin...
The source responsible for V2 (1.398 eV) luminescence in 6H-SiC is recognized as a favorable defect ...
Silicon carbide (SiC) has recently been investigated as an alternative material to host deep optical...
Silicon carbide with engineered point defects is considered as very promising material for the next ...
We study the optical properties of tetravalent-vanadium impurities in 4H silicon carbide. Light emis...
Whereas intrinsic defects in silicon carbide (SiC) have been widely considered for qubit application...
Abstract Spin-active quantum emitters have emerged as a leading platform for quantum technologies. H...
Point defects strongly affect the electrical and optical properties of semiconductors, and are there...
Funding Information: This work has been supported by the Academy of Finland under Project No. 311058...
Trace impurities of vanadium in Lely-grown silicon carbide single crystals have been detected by the...
Defects are common in many materials and some were regarded for years as detrimental. Recently with ...
Typical undoped bulk grown SiC shows n- or p-type conductivity due to residual impurities such as ni...
Color centers in silicon carbide (SiC), such as the negative silicon vacancy (V-Si(-)) and neutral d...
The negatively charged silicon vacancy (V-Si(-)) in silicon carbide is a well-studied point defect f...
Color centers in wide-bandgap semiconductors are attractive systems for quantum technologies since t...
The carbon antisite-vacancy pair (CSiVC) in silicon carbide (SiC) has recently emerged as a promisin...
The source responsible for V2 (1.398 eV) luminescence in 6H-SiC is recognized as a favorable defect ...
Silicon carbide (SiC) has recently been investigated as an alternative material to host deep optical...
Silicon carbide with engineered point defects is considered as very promising material for the next ...