The demand for accuracy and precision at the micro-nano level is constantly increasing in the manufacture of high added value products. This requires control and measurement of the surface structure since surface properties at such tiny scales are the dominant functional determinant. Many commercial instruments have been used for surface measurements. However, these devices are almost always operated in an off-line environment, and are not suitable for on-line application. This paper presents a new interferometry system consisting of a chip tuneable laser for future on-line micro-nano scale surface measurements. It is simple, compact and robust as most environmental noise and disturbance can be eliminated without any servo control system du...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
Spatial light modulators (SLM) developed at the Fraunhofer Institute for Photonic Microsystems (Frau...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
This thesis documents the development of a novel chip interferometry system using advanced microtec...
This project aims to create a novel system based on interferometry and wavelength spatial scanning ...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
A wavelength scanning interferometry system for fast areal surface measurement of micro and nano-sca...
We introduce a new surface measurement method for potential online application. Compared with our pr...
Modern manufacturing processes require better quality control of the manufactured products at a fast...
Lasers have proven to be among the most promising tools for micromachining because they can process ...
AbstractThe optical interferometry systems are widely used for surface metrology. However, the envir...
Surface characterization plays an important role in many manufacturing processes. In this paper we p...
The Fraunhofer Institute for Photonic Microsystems (Fraunhofer IPMS) develops spatial light modulato...
Surface characterization plays an important role in many manufacturing processes. In this paper we ...
Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high s...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
Spatial light modulators (SLM) developed at the Fraunhofer Institute for Photonic Microsystems (Frau...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
This thesis documents the development of a novel chip interferometry system using advanced microtec...
This project aims to create a novel system based on interferometry and wavelength spatial scanning ...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
A wavelength scanning interferometry system for fast areal surface measurement of micro and nano-sca...
We introduce a new surface measurement method for potential online application. Compared with our pr...
Modern manufacturing processes require better quality control of the manufactured products at a fast...
Lasers have proven to be among the most promising tools for micromachining because they can process ...
AbstractThe optical interferometry systems are widely used for surface metrology. However, the envir...
Surface characterization plays an important role in many manufacturing processes. In this paper we p...
The Fraunhofer Institute for Photonic Microsystems (Fraunhofer IPMS) develops spatial light modulato...
Surface characterization plays an important role in many manufacturing processes. In this paper we ...
Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high s...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
Spatial light modulators (SLM) developed at the Fraunhofer Institute for Photonic Microsystems (Frau...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...