Testing of an Intel 14nm desktop processor was conducted under proton irradiation. We share lessons learned, demonstrating that complex devices beget further complex challenges requiring practical and theoretical investigative expertise to solve
The damage tests of microprocessors were carried out under γ-rays. The PIC microprocessors produced ...
In this paper, we perform an evaluation of the impact of radiation-induced micro-architectural fault...
textRadiation causes performance degradation in electronics by inducing atomic displacements and ion...
Hardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor / System...
The purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of...
This paper presents an intended test setup and methodology for testing micro-controller SoCs against...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
A test chip has been designed using standard and radiation tolerant techniques in a 0.25µm Silicon-O...
In this study the 14 nm Intel Broadwell 5th generation core series 5005U-i3 and 5200U-i5 was mounted...
This thesis evaluates the susceptibility to high energy proton irradiation of the NOEL-V soft proces...
Caches are vitally important for the performance in modern CPUs. But they also bear great potential ...
International audienceHardware-implemented intelligent systems running autonomous functions and deci...
Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 1200 microprocessor. Testing was...
© 2020 The bulk irradiation of materials with 10–30 MeV protons promises to advance the study of rad...
This paper presents a new concept of building a high performance, radiation hardened computer from C...
The damage tests of microprocessors were carried out under γ-rays. The PIC microprocessors produced ...
In this paper, we perform an evaluation of the impact of radiation-induced micro-architectural fault...
textRadiation causes performance degradation in electronics by inducing atomic displacements and ion...
Hardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor / System...
The purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of...
This paper presents an intended test setup and methodology for testing micro-controller SoCs against...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
A test chip has been designed using standard and radiation tolerant techniques in a 0.25µm Silicon-O...
In this study the 14 nm Intel Broadwell 5th generation core series 5005U-i3 and 5200U-i5 was mounted...
This thesis evaluates the susceptibility to high energy proton irradiation of the NOEL-V soft proces...
Caches are vitally important for the performance in modern CPUs. But they also bear great potential ...
International audienceHardware-implemented intelligent systems running autonomous functions and deci...
Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 1200 microprocessor. Testing was...
© 2020 The bulk irradiation of materials with 10–30 MeV protons promises to advance the study of rad...
This paper presents a new concept of building a high performance, radiation hardened computer from C...
The damage tests of microprocessors were carried out under γ-rays. The PIC microprocessors produced ...
In this paper, we perform an evaluation of the impact of radiation-induced micro-architectural fault...
textRadiation causes performance degradation in electronics by inducing atomic displacements and ion...