International audienceA novel active microwave interferometric technique is implemented on a multiport vector network analyzer for renormalizing the reference impedance 50 Ohms into any desired complex impedance. The resulting measured reflection coefficient around the new reference impedance is around zero, resulting in high measurement sensitivity. The method proposed avoids any external component commonly found in interferometric setups. In addition, a zeroing process including vector calibration is developed for broad frequency range and requires only a software procedure to be implemented in the system framework
Abstract—In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match ...
Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have g...
Acoustic absorption, reflection, and transmission is typically measured using an impedance tube. We ...
This paper presents a microwave impedance characterization technique for extreme impedance devices. ...
Nano-scale devices and high-power transistors present extreme impedances, which are far removed from...
We describe the development of a novel instrument intended for the measurement of the acoustical ref...
The rapid progress in nanoelectronics showed an urgent need for microwave measurement of impedances ...
We present a new four-state interferometer for measuring vectorial reflection coefficient from 50 to...
Network analysis field has existed for decades, but the most commercial analyzers were larger stand...
A new error model for a special class of multiport vector network analyzers (VNAs) is presented in t...
A calibration procedure for a perturbation two-port vector network analyzer is presented. It consist...
An Overview of the most relevant issues concerning RF and microwave linear measurements is presented...
The changes experienced in technology due to the third industrial revolution have over the years con...
La miniaturisation des composants telle qu’elle est décrite par la loi de Moore se heurte à de nouve...
Nanoscale devices have an intrinsic impedance significantly different than the 50-Ω reference impeda...
Abstract—In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match ...
Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have g...
Acoustic absorption, reflection, and transmission is typically measured using an impedance tube. We ...
This paper presents a microwave impedance characterization technique for extreme impedance devices. ...
Nano-scale devices and high-power transistors present extreme impedances, which are far removed from...
We describe the development of a novel instrument intended for the measurement of the acoustical ref...
The rapid progress in nanoelectronics showed an urgent need for microwave measurement of impedances ...
We present a new four-state interferometer for measuring vectorial reflection coefficient from 50 to...
Network analysis field has existed for decades, but the most commercial analyzers were larger stand...
A new error model for a special class of multiport vector network analyzers (VNAs) is presented in t...
A calibration procedure for a perturbation two-port vector network analyzer is presented. It consist...
An Overview of the most relevant issues concerning RF and microwave linear measurements is presented...
The changes experienced in technology due to the third industrial revolution have over the years con...
La miniaturisation des composants telle qu’elle est décrite par la loi de Moore se heurte à de nouve...
Nanoscale devices have an intrinsic impedance significantly different than the 50-Ω reference impeda...
Abstract—In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match ...
Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have g...
Acoustic absorption, reflection, and transmission is typically measured using an impedance tube. We ...