Reduction of multiple scattering of high-energy positively charged particles during channeling in single crystals

We present the experimental observation of the reduction of multiple scattering of high-energy positively charged particles during channeling in single crystals. According to our measurements the rms angle of multiple scattering in the plane orthogonal to the plane of the channeling is less than half that for non-channeled particles moving in the same crystal. In the experiment we use focusing bent single crystals. Such crystals have a variable thickness in the direction of beam propagation. This allows us to measure rms angles of scattering as a function of thickness for channeled and non-channeled particles. The behaviour with thickness of non-channeled particles is in agreement with expectations whereas the behaviour of channeled particles has unexpected features.We present the experimental observation of the reduction of multiple scattering of high-energy positively charged particles during channeling in single crystals. According to our measurements the rms angle of multiple scattering in the plane orthogonal to the plane of the channeling is less than half that for non-channeled particles moving in the same crystal. In the experiment we use focusing bent single crystals. Such crystals have a variable thickness in the direction of beam propagation. This allows us to measure rms angles of scattering as a function of thickness for channeled and non-channeled particles. The behaviour with thickness of non-channeled particles is in agreement with expectations whereas the behaviour of channeled particles has unexpected features. We give a semi-quantitative explanation of the observed effect