We report recent progress in the construction of a new aberration-corrected photoemission electron microscope. The correcting element in this instrument is a hyperbolic electron mirror which corrects for chromatic and spherical aberration. We present first images obtained with the new instrument and numerical results from trajectory and wave-optical calculations indicating that the resolution can be of the order of 1 nm
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...
A review is provided of the use of aberration-corrected electron microscopy at Oxford from 2003 to t...
A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and bui...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light S...
A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and bu...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
A new high-resolution aberration corrected photoemission electron microscope (PEEM3) will be install...
A new corrector of spherical aberration (C(S)) for a dedicated scanning transmission electron micros...
The design and construction of a double-hexapole aberration corrector has made it possible to build ...
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...
A review is provided of the use of aberration-corrected electron microscopy at Oxford from 2003 to t...
A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and bui...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
We report on the design, assembly, operation and application of an aberration-corrected photoemissio...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light S...
A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and bu...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
Aberration correction by an electron mirror dramatically improves the spatial resolution and transmi...
A new high-resolution aberration corrected photoemission electron microscope (PEEM3) will be install...
A new corrector of spherical aberration (C(S)) for a dedicated scanning transmission electron micros...
The design and construction of a double-hexapole aberration corrector has made it possible to build ...
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...
A review is provided of the use of aberration-corrected electron microscopy at Oxford from 2003 to t...
A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed and bui...