This thesis describes the effort in designing SRAMs based on Carbon Nanotube Field Effect Transistor (CNFET), and covers several aspects including circuit structure, parameters, layout and the detection of diameter variation. It aims at providing a primitive reference on the topic of employing CNFETs in realistic SRAM design. In this thesis, we propose a guideline for choosing appropriate transistor ratios with respect to differently selected diameters in a conventional 6-T SRAM. Constraints of transistor ratios are established, followed by the optimization of the ratios regarding Static Noise Margin (SNM) and Read Noise Margin (RNM) of the cell. With the optimal parameters, the CNFET cell can achieve 41.41% and 1.26% improvement over tradi...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...
As the feature size of silicon semiconductor devices scales down to nanometer range, planar bulk CMO...
In this paper we study the effects of Single Walled Carbon Nanotube (SWCNT) diameter variations on p...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
Carbon nanotube field-effect transistor (CNTFET) refers to a field-effect transistor that utilizes a...
Abstract: CMOS devices are scaling down to nano ranges resulting in increased process variations and...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
Transistor (MOSFET). Moore’s law states that, design performance improves by reduction in gate lengt...
This paper proposed a new concept of highly SNM and low power SRAM cell using carbon nanotube FETs (...
Thesis (Ph.D.), School of Electrical Engineering and Computer Science, Washington State UniversityIn...
In deep sub-micron technology, leakage power consumption has become a major concern in VLSI circuits...
CNFET has emerged as an alternative material to silicon for high performance, high stability and low...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...
As the feature size of silicon semiconductor devices scales down to nanometer range, planar bulk CMO...
In this paper we study the effects of Single Walled Carbon Nanotube (SWCNT) diameter variations on p...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
Carbon nanotube field-effect transistor (CNTFET) refers to a field-effect transistor that utilizes a...
Abstract: CMOS devices are scaling down to nano ranges resulting in increased process variations and...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
Transistor (MOSFET). Moore’s law states that, design performance improves by reduction in gate lengt...
This paper proposed a new concept of highly SNM and low power SRAM cell using carbon nanotube FETs (...
Thesis (Ph.D.), School of Electrical Engineering and Computer Science, Washington State UniversityIn...
In deep sub-micron technology, leakage power consumption has become a major concern in VLSI circuits...
CNFET has emerged as an alternative material to silicon for high performance, high stability and low...
The size and parameter optimization for the 5-nm carbon nanotube field effect transistor (CNFET) sta...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...
In silicon bulk CMOS technology the variability of the device parameters is a key drawback that may ...