Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffraction analysis have been used to characterize the technologically relevant thin copper films and foils. The grain structure and grain orientation of (i) 1-15 mum deposit on the polyimide (PI) substrate, (ii) 5-35 mum free-standing foil and (iii) 200 mum sheet prepared by the industrial scale rolling or electrodeposit process have been examined. It is shown that the rolled foil structure is highly anisotropic due to grain stretching during rolling; the pancaked grains circumscribe a dislocation cell substructure. Thermal exposure in the 423-453 K range results in full anneal softening, while initiating the polygonization of cellular substructure...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
Apart from the scientific interest, texture development in copper thin films is of crucial importanc...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
The relationships between grain morphology, preferred orientation, and mechanical performance of com...
At or above room temperature, metal electrodeposits often feature coarse grains, uneven microstructu...
Oxygen free electronic copper, 99.995% purity, of two initial grain sizes, 50 {mu}m and 100 {mu}m, h...
Textures of copper foils rolled from three initial thickness (0.25, 2.5 and 25 mm) to approximately ...
Production of thin (10 to 200 microns thick) metallic (Cu, CO and Ni-P) foils is performed by electr...
Oxygen-free high conductivity copper was subjected to room temperature equal channel angular extrusi...
Single-crystal Cu not only has high electrical and thermal conductivity, but can also be used as a p...
The present work aims to systematically investigate the influence of P content on the microstructure...
Single-crystal Cu not only has high electrical and thermal conductivity, but can also be used as a p...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
Apart from the scientific interest, texture development in copper thin films is of crucial importanc...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffract...
The relationships between grain morphology, preferred orientation, and mechanical performance of com...
At or above room temperature, metal electrodeposits often feature coarse grains, uneven microstructu...
Oxygen free electronic copper, 99.995% purity, of two initial grain sizes, 50 {mu}m and 100 {mu}m, h...
Textures of copper foils rolled from three initial thickness (0.25, 2.5 and 25 mm) to approximately ...
Production of thin (10 to 200 microns thick) metallic (Cu, CO and Ni-P) foils is performed by electr...
Oxygen-free high conductivity copper was subjected to room temperature equal channel angular extrusi...
Single-crystal Cu not only has high electrical and thermal conductivity, but can also be used as a p...
The present work aims to systematically investigate the influence of P content on the microstructure...
Single-crystal Cu not only has high electrical and thermal conductivity, but can also be used as a p...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in or...
Apart from the scientific interest, texture development in copper thin films is of crucial importanc...