The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it is re-visited by means of detailed comparison of experiments and simulations, using a broad range of metrics that, in addition to grain size, includes the number of sides and the average side class of nearest neighbors. The experimental grain size data reported is large and comprises nearly 35,000 grains from 27 thin film samples of Al and Cu with thicknesses in the range of 25-158 nm. The size distributions for the Al and Cu films are remarkably similar to each other despite the many and significant differences in experimental conditions, which include sputtering target purity, substrate type, film thickness, deposition temperature, actual a...
Among the transition metals, Silver is crucially important. As this metal has a high electrical and ...
The evolution of fibre textured structures is simulated in two dimensions using a generalised phase ...
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length...
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it ...
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it ...
We revisit grain growth and the puzzle of its stagnation in thin metallic films. We bring together a...
We revisit grain growth and the puzzle of its stagnation in thin metallic films. We bring together a...
The grain size and grain growth kinetics in sputter deposited Al-2% Cu films on silicon substrates w...
The grain boundary character distribution (GBCD) of a 100-nm-thick Al thin film was measured as a fu...
It is well known that the grain size of a material controls its properties, including mechanical str...
Microstructural and texture evolution during grain growth in polycrystalline thin films was investig...
The mechanisms that have been proposed to govern the grain structure of vapor deposited metallic fil...
At fixed hold temperatures, grain growth usually stagnates indefinitely after sufficiently long hold...
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, ...
Among the transition metals, Silver is crucially important. As this metal has a high electrical and ...
The evolution of fibre textured structures is simulated in two dimensions using a generalised phase ...
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length...
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it ...
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle. Here it ...
We revisit grain growth and the puzzle of its stagnation in thin metallic films. We bring together a...
We revisit grain growth and the puzzle of its stagnation in thin metallic films. We bring together a...
The grain size and grain growth kinetics in sputter deposited Al-2% Cu films on silicon substrates w...
The grain boundary character distribution (GBCD) of a 100-nm-thick Al thin film was measured as a fu...
It is well known that the grain size of a material controls its properties, including mechanical str...
Microstructural and texture evolution during grain growth in polycrystalline thin films was investig...
The mechanisms that have been proposed to govern the grain structure of vapor deposited metallic fil...
At fixed hold temperatures, grain growth usually stagnates indefinitely after sufficiently long hold...
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, ...
Among the transition metals, Silver is crucially important. As this metal has a high electrical and ...
The evolution of fibre textured structures is simulated in two dimensions using a generalised phase ...
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length...