Modeling of the collector-base junction capacitance of the advanced bipolar transistors operating at avalanche breakdown is developed. The comprehensive junction capacitance model accounts for high current and high field effects at the collector-base junction. The impact ionization generates tremendous amount of free carriers in the collector-base space-charge region which increases the collector-base junction capacitance at the avalanche breakdown regime. The present collector-base junction capacitance is useful for device and circuit design under avalanche breakdown prior to the actual fabrication of the circuit
Un modèle pour transistor bipolaire, qui tient compte des variations des résistances de base et de c...
The purpose of this thesis is the extension of Gunn\u27s work on the avalanche phenomenon and the co...
The performance of heterojunction bipolar transistors operating in the avalanche breakdown regime ha...
Modeling of the collector–base junction capacitance of the advanced bipolar transistors operating at...
Modeling the cutoff frequency (f(T)) of the advanced bipolar transistors at avalanche breakdown has ...
An analytical physics-based comprehensive base-collector junction capacitance model is presented. Th...
A complete analytical model for impact ionization effects in bipolar transistors, which is able to p...
A complete analytical model for impact ionization effects in bipolar transistors, which is able to p...
This paper describes a new analysis of the avalanche breakdown phenomenon in bipolar transistors for...
Impact ionization in the reverse-biased base-collector space-charge layer of the bipolar junction tr...
Modeling of the effects occurring outside the usual region of application of semiconductor devices i...
Impact ionization in the reverse-biased base-collector space-charge layer of the bipolar junction tr...
When a triangular shape for the electric field in the base-collector space-charge region of an n-p-n...
The base‐collector heterojunction space‐charge‐region capacitance of double heterojunction bipolar t...
Reverse base current (RBC) phenomenon results from avalanche multiplication process can occur in adv...
Un modèle pour transistor bipolaire, qui tient compte des variations des résistances de base et de c...
The purpose of this thesis is the extension of Gunn\u27s work on the avalanche phenomenon and the co...
The performance of heterojunction bipolar transistors operating in the avalanche breakdown regime ha...
Modeling of the collector–base junction capacitance of the advanced bipolar transistors operating at...
Modeling the cutoff frequency (f(T)) of the advanced bipolar transistors at avalanche breakdown has ...
An analytical physics-based comprehensive base-collector junction capacitance model is presented. Th...
A complete analytical model for impact ionization effects in bipolar transistors, which is able to p...
A complete analytical model for impact ionization effects in bipolar transistors, which is able to p...
This paper describes a new analysis of the avalanche breakdown phenomenon in bipolar transistors for...
Impact ionization in the reverse-biased base-collector space-charge layer of the bipolar junction tr...
Modeling of the effects occurring outside the usual region of application of semiconductor devices i...
Impact ionization in the reverse-biased base-collector space-charge layer of the bipolar junction tr...
When a triangular shape for the electric field in the base-collector space-charge region of an n-p-n...
The base‐collector heterojunction space‐charge‐region capacitance of double heterojunction bipolar t...
Reverse base current (RBC) phenomenon results from avalanche multiplication process can occur in adv...
Un modèle pour transistor bipolaire, qui tient compte des variations des résistances de base et de c...
The purpose of this thesis is the extension of Gunn\u27s work on the avalanche phenomenon and the co...
The performance of heterojunction bipolar transistors operating in the avalanche breakdown regime ha...