A new field of study in the polymer science and engineering is being opened with the use of scanning tunneling microscope (STM), atomic force microscope (AFM), and scanning probe microscope (SPM). In this short review article several examples are given with comments. They are direct observation of poly(macromonomer), structure of a cross-linking domain of a gel, and observation of topochemically photopolymerizable conjugated aromatic compound. Moreover, nanorheological properties of polymer blends are shown as an example of the application of AFM force curve measurements. There are many possibilities of application of SPM to nanoscopic studies on polymer molecules
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
Methods based on the atomic force microscope (AFM) were implemented or developed to measure and map ...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
has become an advanced micr o-scopic method for examining polymer materials for such applications as...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
Abstract With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano...
The atomic force microscope (AFM) is a very promising and powerful tool for investigating a range of...
The nanochemical characterization of organic/polymer surfaces is an increasing technological need th...
The nanochemical characterization of organic/polymer surfaces is an increasing technological need th...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
Methods based on the atomic force microscope (AFM) were implemented or developed to measure and map ...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
has become an advanced micr o-scopic method for examining polymer materials for such applications as...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
In this contribution, the general concepts of force microscopy will be presented together with its a...
Abstract With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano...
The atomic force microscope (AFM) is a very promising and powerful tool for investigating a range of...
The nanochemical characterization of organic/polymer surfaces is an increasing technological need th...
The nanochemical characterization of organic/polymer surfaces is an increasing technological need th...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
Methods based on the atomic force microscope (AFM) were implemented or developed to measure and map ...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...