The unusual fluorescence X-ray intensity variations in iron-silicon and aluminium-silicon-copper alloys have been investigated. In these alloys, the unusual behaviour was found not only in the fluorescence X-ray intensity of the Si Kα line but also in that of Fe Kα. It was confirmed that the phenomenon occurred not only when the primary crystals having large differences of the mass-absorption coefficients for the X-ray of the elements to be analyzed precipitated on both sides of the eutectic point and/or the intermetallic compound but also when there was a large difference in the effective volume ratio between the primary phase and the secondary phase. Therefore, the phenomenon should be considered in the fluorescence X-ray analysis of actu...
Chemical effects on Kβ/Kα X-ray intensity ratios for some Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn compo...
The numerical simulations of Cu Kα and Cu Kβ fluorescence lines induced by Rh X-ray tube and by mono...
The material quality of multicrystalline silicon is influenced by crystal defects and contaminations...
The unusual fluorescence X-ray intensity variation in some aluminiun and magnesium alloys was invest...
X-Ray fluorescence analysis has the virtue of making it possible to determine several elements witho...
The technique of definition of iron concentration in a surface layer of Si(100) is developed by use ...
Analysis of intra- and inter-phase distribution of modifying elements in aluminium-silicon alloys is...
We report Ni K-edge fluorescence x-ray absorption fine structure spectra (XAFS) for Fe₀.₇₅Ni₀.₀₅S₀.₂...
In order to analyse alloying elements in various alloys by x-ray fluorescent spectroscopy, a correct...
Understanding the influence of iron impurity on the formation of the structure and the properties of...
X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spec...
First it is established that Zn is excited by the WLß1 line. This must be taken into account when ca...
K shell X-ray fluorescence cross-sections (σKα, σKβ and σK), and K shell fluorescence yields (ωK) of...
The paper presents an analysis of a selected grade of high silicon cast iron intended for work in co...
X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spe...
Chemical effects on Kβ/Kα X-ray intensity ratios for some Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn compo...
The numerical simulations of Cu Kα and Cu Kβ fluorescence lines induced by Rh X-ray tube and by mono...
The material quality of multicrystalline silicon is influenced by crystal defects and contaminations...
The unusual fluorescence X-ray intensity variation in some aluminiun and magnesium alloys was invest...
X-Ray fluorescence analysis has the virtue of making it possible to determine several elements witho...
The technique of definition of iron concentration in a surface layer of Si(100) is developed by use ...
Analysis of intra- and inter-phase distribution of modifying elements in aluminium-silicon alloys is...
We report Ni K-edge fluorescence x-ray absorption fine structure spectra (XAFS) for Fe₀.₇₅Ni₀.₀₅S₀.₂...
In order to analyse alloying elements in various alloys by x-ray fluorescent spectroscopy, a correct...
Understanding the influence of iron impurity on the formation of the structure and the properties of...
X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spec...
First it is established that Zn is excited by the WLß1 line. This must be taken into account when ca...
K shell X-ray fluorescence cross-sections (σKα, σKβ and σK), and K shell fluorescence yields (ωK) of...
The paper presents an analysis of a selected grade of high silicon cast iron intended for work in co...
X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spe...
Chemical effects on Kβ/Kα X-ray intensity ratios for some Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn compo...
The numerical simulations of Cu Kα and Cu Kβ fluorescence lines induced by Rh X-ray tube and by mono...
The material quality of multicrystalline silicon is influenced by crystal defects and contaminations...