Radiation-induced luminescence in terbium-doped silicate glasses

The purpose of this study is to characterize radiation-induced luminescence of terbium-doped silicate glasses. Experiments performed investigated the optical properties, isothermal time-evolution, and temperature dependence of the radiation-induced luminescence of two commercially available terbium-doped glasses. A problem common to this type of glass is the persistent luminescence, or afterglow, that occurs following the end of excitation from an external source of radiation. While the processes that govern characteristic luminescence of rare earth ions, including terbium, are well understood, the processes that give rise to afterglow in doped glasses are not. Identifying the source of long-term luminescence is essential for controlling problems that may arise from practical applications of luminescent glasses.;It was determined that the stimulation of terbium fluorescence is the result of direct excitation from the external radiation source, and indirect excitation from the delayed recombination of charge carriers releasing from traps in the host glass. The range of trap depths is found to be well represented by quasi-continuous distribution functions. The characteristic decay time during the initial response of both glasses studied is approximately 3.5 milliseconds. Decay of the afterglow was observed to persist for several hours, depending on the acquired dose of radiation. Comparison of the response to x-rays and ultraviolet radiation yielded the same results, indicating that the same processes are involved in producing afterglow for both cases. This result suggests a more efficient means of characterizing scintillating glasses by using ultraviolet lasers instead of x-rays