The emission angle and the transverse momentum distributions of projectile fragments (PFs) produced in fragmentation of silicon on carbon and polyethylene targets at 800 A MeV are measured. It is found that the angular and transverse distribution of PFs do not evidently depend on the mass of target nucleus, the averaged emission angle and transverse momentum decrease with increase of the charge of PF for the same target, and no obvious dependence on the target mass is found for the same PF. The cumulated squared transverse momentum distribution of PF can be well explained by a single Rayleigh distribution. The temperature parameter of PF emission source is determined, which is about 2-4 MeV and independent of the target and PF size
The total charge changing and partial projectile fragment production cross sections of 471 A MeV 56F...
Intermediate mass fragment (IMF: 3≤Z≤20 emission from necklike structures joining projectilelike and...
Thin films of poly(ethylene terephthalate) (PET) cast on silicon were bombarded by 2-22 keV In+ ions...
AbstractThe emission angle and the transverse momentum distributions of projectile fragments (PFs) p...
The emission angle distribution of projectile fragments (PFs) and the temperature of PF emission sou...
The emission angle and the transverse momentum distributions of projectile fragments (PFs) produced ...
The emission angle distributions of projectile fragments (PFs) and the temperature of PFs emission s...
Measurements of fragment emission angles for 57 and 93 MeV/nucleon C-12 and 95 MeV/nucleon O-16 proj...
AbstractThe total charge changing cross sections and the partial cross sections of projectile fragme...
The total charge changing cross sections and the partial cross sections of projectile fragment produ...
The total charge-changing cross-sections and the partial cross-sections for projectile fragments (PF...
Measurements of fragment emission angles for 57 and 93 MeV/nucleon C-12 and 95 MeV/nucleon O-16 proj...
The total charge-changing cross-section and the partial cross-section of projectile fragments (PFs) ...
The total charge-changing cross sections and the partial cross sections of silicon ions on carbon an...
The longitudinal and transverse momentum (PL and PYenT) distributions of projectile-like fragments, ...
The total charge changing and partial projectile fragment production cross sections of 471 A MeV 56F...
Intermediate mass fragment (IMF: 3≤Z≤20 emission from necklike structures joining projectilelike and...
Thin films of poly(ethylene terephthalate) (PET) cast on silicon were bombarded by 2-22 keV In+ ions...
AbstractThe emission angle and the transverse momentum distributions of projectile fragments (PFs) p...
The emission angle distribution of projectile fragments (PFs) and the temperature of PF emission sou...
The emission angle and the transverse momentum distributions of projectile fragments (PFs) produced ...
The emission angle distributions of projectile fragments (PFs) and the temperature of PFs emission s...
Measurements of fragment emission angles for 57 and 93 MeV/nucleon C-12 and 95 MeV/nucleon O-16 proj...
AbstractThe total charge changing cross sections and the partial cross sections of projectile fragme...
The total charge changing cross sections and the partial cross sections of projectile fragment produ...
The total charge-changing cross-sections and the partial cross-sections for projectile fragments (PF...
Measurements of fragment emission angles for 57 and 93 MeV/nucleon C-12 and 95 MeV/nucleon O-16 proj...
The total charge-changing cross-section and the partial cross-section of projectile fragments (PFs) ...
The total charge-changing cross sections and the partial cross sections of silicon ions on carbon an...
The longitudinal and transverse momentum (PL and PYenT) distributions of projectile-like fragments, ...
The total charge changing and partial projectile fragment production cross sections of 471 A MeV 56F...
Intermediate mass fragment (IMF: 3≤Z≤20 emission from necklike structures joining projectilelike and...
Thin films of poly(ethylene terephthalate) (PET) cast on silicon were bombarded by 2-22 keV In+ ions...