In this paper a new fast fault simulation technique is presented for calculation of fault propagation through HLPs (High Level Primitives). ROTDDs (Reduced Ordered Ternary Decision Diagrams) are used to describe HLP modules. The technique is implemented in the HTDD RT-level fault simulator. The simulator is evaluated with some ITC99 benchmarks. A hypothesis is proved that a test set coverage of physical failures can be anticipated with high accuracy when RTL fault model takes into account optimization strategies that are used in CAE system applied
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Abstract—As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tediou...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
Functional verification techniques based on fault injection and simulation at register-transfer leve...
The growing size and complexity of VLSI circuits is creating a need for more efficient design automa...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
A new method for hierarchical fault simulation based on multilevel Decision Diagrams (DD) is propose...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Different fault injection techniques based on simulation have been proposed in the past for function...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
In sequential circuit fault simulation, the hypertrophic faults, which result from lengthened initia...
96 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1988.In the discipline of digital c...
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Abstract—As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tediou...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
Functional verification techniques based on fault injection and simulation at register-transfer leve...
The growing size and complexity of VLSI circuits is creating a need for more efficient design automa...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
A new method for hierarchical fault simulation based on multilevel Decision Diagrams (DD) is propose...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
Different fault injection techniques based on simulation have been proposed in the past for function...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
In sequential circuit fault simulation, the hypertrophic faults, which result from lengthened initia...
96 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1988.In the discipline of digital c...
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
94 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.The goals of this thesis are t...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...