Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs). In this paper, we developed a new workflow to evaluate SET phenomena in a specific convergence case and introduce a new mitigation of SET pulse without introducing any performance penalization to the original netlist
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
We propose a new design flow for implementing circuits hardened against SET effects af- fecting Flas...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
We propose a new design flow for implementing circuits hardened against SET effects af- fecting Flas...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...