Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In this paper, we develop a new SET mitigation approach not introducing timing degradation. Experimental results on Flash-based FPGAs demonstrate its effectiveness
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Flash-based FPGAs are more and more interesting for space applications because of their robustness a...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
We propose a new design flow for implementing circuits hardened against SET effects af- fecting Flas...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Flash-based FPGAs are more and more interesting for space applications because of their robustness a...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
We propose a new design flow for implementing circuits hardened against SET effects af- fecting Flas...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Flash-based FPGAs are more and more interesting for space applications because of their robustness a...
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