This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient phenomena within the silicon structure of Microsemi RTG4 Radiation hardened Flash-based FPGAs. Experimental results on three benchmark circuits demonstrated effective SET mitigation
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
One of the main concern for FPGA adopted in mission critical application such as space and avionic f...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
One of the main concern for FPGA adopted in mission critical application such as space and avionic f...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
XXI Conference on Design of Circuits and Integrated Systems (DCIS06)The outstanding versatility of S...
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing comp...