Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring more evident variability in the technology parameters of the semiconductors fabrication process. That variability results in otherwise identical designs displaying very different performances, power consumption levels and lifespans once fabricated. Hence, process variability may lead to execution uncertainties, impacting the expected quality of service and energy efficiency of the running software. As such uncertainties are intolerable in certain application domains such as automotive and avionic infotainment systems, it has become a persistent necessity to customize runtime engines to introduce measures for variability awareness in task allo...