Transient faults can affect the behavior of electronic systems, and represent a major issue in many safety-critical applications. This paper focuses on Control Flow Errors (CFEs) and extends a previously proposed method, based on the usage of the debug interface existing in several processors/controllers. The new method achieves a good detection capability with very limited impact on the system development flow and reduced hardware cost: moreover, the proposed technique does not involve any change either in the processor hardware or in the application software, and works even if the processor uses caches. Experimental results are reported, showing both the advantages and the costs of the method
This paper deals with a software modification strategy allowing on-line detection of transient error...
International audienceSoft errors with multiple erroneous bits have become a significant threat in e...
ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI ...
Detecting the effects of transient faults is a key point in many processor-based safety-critical app...
Many software-implemented control flow error detection techniques have been proposed over the years....
Abstract—This paper evaluates the concurrent error detection capabilities of system-level checks, us...
Today, embedded systems are being used in many (safety-critical) applications. However, due to their...
Software-based methods for the detection of control-flow errors caused by transient fault usually co...
This paper investigates the effects of a class of transient faults, the so-called Single Event Upset...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
A common requirement of embedded software in charge of safety tasks is to guarantee the identificati...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
Hybrid error-detection techniques combine software techniques with an external hardware module that ...
The use of microprocessor-based systems is gaining importance in application domains where safety is...
This paper deals with a software modification strategy allowing on-line detection of transient error...
International audienceSoft errors with multiple erroneous bits have become a significant threat in e...
ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI ...
Detecting the effects of transient faults is a key point in many processor-based safety-critical app...
Many software-implemented control flow error detection techniques have been proposed over the years....
Abstract—This paper evaluates the concurrent error detection capabilities of system-level checks, us...
Today, embedded systems are being used in many (safety-critical) applications. However, due to their...
Software-based methods for the detection of control-flow errors caused by transient fault usually co...
This paper investigates the effects of a class of transient faults, the so-called Single Event Upset...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
A common requirement of embedded software in charge of safety tasks is to guarantee the identificati...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
Hybrid error-detection techniques combine software techniques with an external hardware module that ...
The use of microprocessor-based systems is gaining importance in application domains where safety is...
This paper deals with a software modification strategy allowing on-line detection of transient error...
International audienceSoft errors with multiple erroneous bits have become a significant threat in e...
ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI ...