Add to ORKGThe interesting expectations on nanoarray based circuits are counterbalanced by critical issues related to reliability. Nanowires and active devices currently cannot rely on a mature technology and high rates of defects are still to be expected. Our approach to evaluate the effects on nanoarray based circuits behavior consists in simulating at switch level the precise behavior of the circuit considering a statistical distribution of faults throughout the tile area. We are able to reckon the output error rate of nanoarray circuits as a function of defective rates and defect distribution giving to both technologists and architects directions to find possible solutions
This paper presents a new approach for monitoring and estimating device reliability of nanometer-sca...
With molecular-scale materials, devices and fabrication techniques recently being developed, high-de...
In this article we present an architecture that supports fine-grained sparing and resource matching....
We automatically maximize fault-tolerance in nanoarrays based on silicon nanowires and Gate-All-Arou...
Density and regularity are deemed as the major advantages of nanoarray architectures based on nanowi...
Nanotechnology-based devices are believed to be the future possible alternative to CMOS-based device...
High defect rates are associated with novel nanodevice-based systems owing to unconventional and sel...
With molecular-scale materials and fabrication techniques recently developed, high-density computing...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
ACM Comput. Surv. Volume 50, issue 6 (November 2017)Nano-crossbar arrays have emerged as a promisin...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
It is widely acknowledged that nanoelectronic devices will suffer from more manufacturing and operat...
none5Several alternative building blocks have been proposed to replace planar transistors, among whi...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
The semiconductor industry is now facing challenges to keep pace with Moore’s law and this lea...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-sca...
With molecular-scale materials, devices and fabrication techniques recently being developed, high-de...
In this article we present an architecture that supports fine-grained sparing and resource matching....
We automatically maximize fault-tolerance in nanoarrays based on silicon nanowires and Gate-All-Arou...
Density and regularity are deemed as the major advantages of nanoarray architectures based on nanowi...
Nanotechnology-based devices are believed to be the future possible alternative to CMOS-based device...
High defect rates are associated with novel nanodevice-based systems owing to unconventional and sel...
With molecular-scale materials and fabrication techniques recently developed, high-density computing...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
ACM Comput. Surv. Volume 50, issue 6 (November 2017)Nano-crossbar arrays have emerged as a promisin...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
It is widely acknowledged that nanoelectronic devices will suffer from more manufacturing and operat...
none5Several alternative building blocks have been proposed to replace planar transistors, among whi...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
The semiconductor industry is now facing challenges to keep pace with Moore’s law and this lea...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-sca...
With molecular-scale materials, devices and fabrication techniques recently being developed, high-de...
In this article we present an architecture that supports fine-grained sparing and resource matching....