This paper presents a set of algorithms for the correction of measurement errors of a prototype system designed for Large Scale Dimensional Metrology (LSDM) applications. The system, developed in the Quality and Industrial Metrology Laboratory of Politecnico di Torino, is based on the principles of photogrammetry and consists of a set of cameras wirelessly connected to a central unit able to track the position of a portable contact probe. Due to its architecture the system is affected by several systematic error sources. This paper addresses some of them: the distortion of the lenses, the dimension of the probe tip and the kinematic of the probe. By means of the implementation of appropriate mathematical correction models, the overall syste...
Abstract Large scale metrology refers to dimensional measurement of objects or features of perhaps a...
The last decades have shown great improvements in the field of engineering dimensional metrology. Th...
The aim of this paper is to examine the metrological characteristics of some of the most commonly us...
This paper presents three mathematical models for the correction of measurement errors of a prototyp...
According to the increasing interest in metrological systems for the dimensional measurements of la...
Mobile Spatial coordinate Measuring System (MScMS) is a wireless-sensor-network based systemdevelope...
Large scale measuring systems, i.e. measuring systems characterized by a measurement volume from som...
AbstractLarge scale measuring systems, i.e. measuring systems characterized by a measurement volume ...
According to the increasing interest in metrological systems for the dimensional measureme...
AbstractLarge scale measuring systems, i.e. measuring systems characterized by a measurement volume ...
In many branches of industry, most of manufacturing efforts are directed toward producing objects of...
Large-Volume Dimensional Metrology (LVDM) deals with dimensional inspection of large objects with di...
Large scale metrology refers to dimensional measurement of objects or features of perhaps a ten of m...
According to the current great interest concerning large-scale metrology applications in many diff...
In dimensional inspection of large objects, portable measuring systems are greatly involved in a wea...
Abstract Large scale metrology refers to dimensional measurement of objects or features of perhaps a...
The last decades have shown great improvements in the field of engineering dimensional metrology. Th...
The aim of this paper is to examine the metrological characteristics of some of the most commonly us...
This paper presents three mathematical models for the correction of measurement errors of a prototyp...
According to the increasing interest in metrological systems for the dimensional measurements of la...
Mobile Spatial coordinate Measuring System (MScMS) is a wireless-sensor-network based systemdevelope...
Large scale measuring systems, i.e. measuring systems characterized by a measurement volume from som...
AbstractLarge scale measuring systems, i.e. measuring systems characterized by a measurement volume ...
According to the increasing interest in metrological systems for the dimensional measureme...
AbstractLarge scale measuring systems, i.e. measuring systems characterized by a measurement volume ...
In many branches of industry, most of manufacturing efforts are directed toward producing objects of...
Large-Volume Dimensional Metrology (LVDM) deals with dimensional inspection of large objects with di...
Large scale metrology refers to dimensional measurement of objects or features of perhaps a ten of m...
According to the current great interest concerning large-scale metrology applications in many diff...
In dimensional inspection of large objects, portable measuring systems are greatly involved in a wea...
Abstract Large scale metrology refers to dimensional measurement of objects or features of perhaps a...
The last decades have shown great improvements in the field of engineering dimensional metrology. Th...
The aim of this paper is to examine the metrological characteristics of some of the most commonly us...