Symbolic state space exploration techniques proved to be useful not only in formal verification and synthesis, but also in testing. Most of them are based on exact forward or backward traversal. As an alternative, approximate forward traversal algorithms have been proposed, but they are not immediately applicable to test pattern generation. This paper presents strategies for approximate forward traversal, then it combines approximate forward traversal and backward traversal for generating test patterns for hard to detect faults. Efficient search space pruning is obtained by means of cofactoring. Experimental results show that the speed up ranges from 2 to more than 50
The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir di...
In this work we propose a novel concept called state tuple to represent the states of lines in a cir...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
A powerful combinational path sensitization engine is required for the efficient implementation of t...
In this thesis, optimal and near-optimal algorithms are developed for various classes of single faul...
This dissertation describes an innovative approach to the state justification portion of the sequent...
This thesis addresses the problem of backtracking strategies in test generation. First, a methodolog...
Boundary value analysis is a typical conventional testing technique. However, manually identifying i...
peer reviewedDetection of infeasible paths is required in many areas including test coverage analysi...
A recent promising technique for fault localization, Backward-Slice-based Statistical Fault Localiza...
We present a technique which generates from Abstract State Machines specifications a set of test seq...
ISBN: 0818674784This paper presents a new test pattern generation technique for complex systems. It ...
The new test pattern generation system for path delay faults in combinational logic circuits conside...
Path-wise test data generation is generally considered an important problem in the automation of sof...
[[abstract]]In this paper we propose a method for generating test patterns very efficient for stuck-...
The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir di...
In this work we propose a novel concept called state tuple to represent the states of lines in a cir...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...
A powerful combinational path sensitization engine is required for the efficient implementation of t...
In this thesis, optimal and near-optimal algorithms are developed for various classes of single faul...
This dissertation describes an innovative approach to the state justification portion of the sequent...
This thesis addresses the problem of backtracking strategies in test generation. First, a methodolog...
Boundary value analysis is a typical conventional testing technique. However, manually identifying i...
peer reviewedDetection of infeasible paths is required in many areas including test coverage analysi...
A recent promising technique for fault localization, Backward-Slice-based Statistical Fault Localiza...
We present a technique which generates from Abstract State Machines specifications a set of test seq...
ISBN: 0818674784This paper presents a new test pattern generation technique for complex systems. It ...
The new test pattern generation system for path delay faults in combinational logic circuits conside...
Path-wise test data generation is generally considered an important problem in the automation of sof...
[[abstract]]In this paper we propose a method for generating test patterns very efficient for stuck-...
The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir di...
In this work we propose a novel concept called state tuple to represent the states of lines in a cir...
Test generation for combinational circuits is an important step in the VLSI design process. Unfortun...